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01/02/2018

NI PXI SMU enhances channel density up to 6x for semiconductor test systems

As a vendor dedicated to providing engineers and scientists with platform-based system solutions to address the world's most demanding engineering challenges, today announced the PXIe-4163 High-Density SourceMeasurement Unit (SMU), which provides a higher-performance, Up to 6X DC channel density, SMU is suitable for testing RF, MEMS and mixed-signal and other analog semiconductor components.

Eric Starkloff, National Instruments Vice President of Global Sales and Marketing, said: "The revolutionary technological developments in 5G, IoT and autonomous vehicles continue to exert ongoing pressure on semiconductor companies to adopt a more efficient approach, both in the lab environment and in the production floor Semiconductor testing is the strategic focus of NI. We are expanding our software platform and PXI capabilities to help chipmakers meet their biggest challenges, as demonstrated by the latest NI PXI SMU. " m6965-3

Due to its high throughput, cost-effective and small footprint, NI's semiconductor test systems (STS) are rapidly being used in chip manufacturing. The new PXIe-4163 SMU further enhances these capabilities by providing higher DC channel densities, greater parallelism in multi-site applications, and laboratory-quality measurement in production. With this combination, engineers can verify with the same instruments in the lab and in the production floor, reducing the challenge of measuring the data correlation and thus reducing time-to-market. eeefk1h221p

Engineers can use the new PXIe-4163 SMU in STS configurations or in separate PXI systems. Key product features include:

Up to 24 channels in a single PXI Express slot

Voltage range 24 V per channel

Up to 100 mA source / drain current per channel

· 100 pA current sensitivity

Up to 100 kS / s sample rate and update rate

SourceAdapt technology to minimize overshoot and vibration

Interactive configuration and debugging software

Up to 408 high-precision SMU channels (4U rack space) in a single PXI chassis

· Full STS support including system-level cabling, calibration and pin mapping support

Introduced in 2014, STS provides a disruptive test methodology for semiconductor manufacturing. Based on the NI PXI platform, it helps engineers build smarter test systems. The PXI platform includes 1 GHz bandwidth vector signal transceivers, fA grade SMUs, TestStand's industry-leading commercial off-the-shelf test management software, and more than 600 PXI products with frequencies ranging from DC to mmWave.